Ultra-High Precision Electron Beam Lithography System

Electron Beam 3D Surface Roughness Analyzer

High-Resolution SEM Sample Coating System

 

Company's Status after the Tohoku district-off the Pacific Earthquake

ELIONIX INC. would like to express our deepest sympathy to those affected by the earthquake that occured in the Tohoku region on March 11th.

We would like to inform that ELIONIX INC. has not expereinced any damage to our facilities and that all of employees are safe and unharmed.
We are already back to the normal operation and are doing our best to achieve customer sartisfaction, as we are always doing.

Topics

2010/02:
Elionix won Nano-fabrication Technology Award from Nano-Tech 2010 International Nanotechnology Exhibition & Conference.
2010/02:
Elionix announced the new E-beam lithography "ELS-F125".
2009/12:
Yoshiyuki Makiuchi became President, COO.
Seigo Honme became Chairman of the Board, CEO.
2008/09:
Elionix has reached an agreement with SRI International to collaborate for the advancement of SRI's FRASTA (Fracture Surface Topography Analysis) technology. ERA-8900, electron probe surface roughness analyzer, will play a key role in this technology advancement.
2008/06:
SEMTech Solutions (The representative in USA) will participate in the tradeshow of NSTI Nanotech 2008 (6/1-5, Bosoton, Booth #: 616). The information about the tradeshow is in http://www.nsti.org/Nanotech2008/.
2008/05:
SEMTech Solutions (The representative in USA) participated in the tradeshow of EIPBN (5/27 -30, Portland). The information about the tradeshow is in http://www.eipbn.org/
2008/03:
ELS-7500EX was exhibited at National Chiao Tung University (Taiwan)

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