- Will exhibit at [nano tech 2016].
- December 2015
Exhibited at the conference [SEMICON Japan 2015].
- August 2015
Introduced [ERA-600], Surface Roughness Analysis 3D Scanning Electron Microscope.
- September 2014
Introduced [ELS-S50], 50kV Electron Beam Lighography System.
- August 2014
Introduced [ERA-600FE], Surface Roughness Analysis 3D Scanning Electron Microscope.
- Elionix Inc was choosed and awarded as a [Global Nich Top Company Top 100] from the Minestry of Ministry of Economy, Trade and Industry.
- January 2014
Introduced [ELS-F100], 100kV Electron Beam Lighography System.